Processing Magazine

MVL Multi-Scanner System for Very Large Silos

August 11, 2010

The MVL multiple scanner system integrates multiple point measurement data from two 3DLevelScanners to cover a very wide surface area and provide better inventory accuracy for large vessels than any other level measurement device, according to the manufacturer. Designed specifically for the challenges of very large bins, the MVL system displays a visual representation of the material surface that shows high and low points in the bin such as cone up, cone down, sidewall buildup or bridging. Reports generated by the 3D software provide data such as volume as a percentage, in bushels, or cubic feet or meters; maximum, minimum and average levels or distances to product; weight in U.S. tons, pounds or metric tons; and historical logs of bin measurements.