Processing Magazine

US Patent Awarded for Chemical Detection Technology

August 9, 2011

1st Detect Corporation, a subsidiary of Astrotech Corporation, announced that the United States Patent and Trademark Office (USPTO) has issued a key patent for the company''s unique method to drive a mass spectrometer ion trap used for chemical detection and identification. The patent, titled “Driving a Mass Spectrometer Ion Trap or Mass Filter,” represents a key technological advantage for 1st Detect to constantly monitor the ion trap and dynamically adjust to changing parameters for optimized performance.