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BinMaster

Analog expansion console monitors multiple bins with less equipment

June 22, 2009
The Analog Expansion Console enables monitoring of multiple bins equipped with sensors from a single C-100 Control Console, offering the benefits of significantly reducing the amount of equipment needed
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New 3DLevel Scanner creates visual map of material surface

February 9, 2009
The 3DLevelScanner uses non-contact, dust penetrating technology to create a visual map of the material surface in storage and process bins. It measures the material surface at multiple points to
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