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US Patent Awarded for Chemical Detection Technology

August 09, 2011
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1st Detect Corporation, a subsidiary of Astrotech Corporation, announced that the United States Patent and Trademark Office (USPTO) has issued a key patent for the company''s unique method to drive a mass spectrometer ion trap used for chemical detection and identification. The patent, titled “Driving a Mass Spectrometer Ion Trap or Mass Filter,” represents a key technological advantage for 1st Detect to constantly monitor the ion trap and dynamically adjust to changing parameters for optimized performance.

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