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BinMaster

BinMaster

ARTICLES

Level Sensor for Reliable, Non-contact Level Measurement in Bins

October 29, 2013
BinMaster Level Controls introduces the new BinMaster RL level sensor designed to provide highly reliable bin level data in challenging environments where dust levels are extremely high.
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Bendable Capacitance Probe

May 7, 2013
BinMaster Level Controls has developed a bendable capacitance probe designed to fit in tight spaces or in vessels where obstructions prevent the installation of a straight probe.
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Level Scanner

February 22, 2013
BinMaster Level Controls introduces the 3DLevelScanner HT for measuring the volume and mapping the material surface in bins, tanks and silos with high temperatures.
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Capacitance Probe with Remote Electronics for Hostile Environments

October 24, 2011
The newly designed Pro Remote capacitance probe from BinMaster Level Controls offers the ability to mount the sensor’s electronic components up to 75 feet away from the sensing probe. This
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SmartBob-TS1 Sensor for Bins up to 60 Feet

January 24, 2011
SmartBob-TS1 cable-based sensor is designed for bins up to 60-feet-tall. The continuous level measurement sensor is ideal for operations with multiple, smaller storage and process bins containing powders or bulk
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Horizontal Rotary Extension for Thick Bin Walls

November 22, 2010
The horizontal rotary extension provides the ability to install a rotary through the side of a bin wall, such as those in concrete silos, up to 12-inches-thick. This rotary extension
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MVL Multi-Scanner System for Very Large Silos

August 11, 2010
The MVL multiple scanner system integrates multiple point measurement data from two 3DLevelScanners to cover a very wide surface area and provide better inventory accuracy for large vessels than any
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Capacitance Probes with Flexible Time Delays for Covered and Uncovered Conditions

May 26, 2010
The dual timer capacitance probes feature a flexible time delay for covered and uncovered conditions, allowing the user to set a probe to react either immediately or with up to
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Analog expansion console monitors multiple bins with less equipment

June 22, 2009
The Analog Expansion Console enables monitoring of multiple bins equipped with sensors from a single C-100 Control Console, offering the benefits of significantly reducing the amount of equipment needed
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New 3DLevel Scanner creates visual map of material surface

February 9, 2009
The 3DLevelScanner uses non-contact, dust penetrating technology to create a visual map of the material surface in storage and process bins. It measures the material surface at multiple points to
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